In‐situ‐photometer for thin‐film processes

Abstract

Multilayer coating systems used for beam‐splitters, colour conversation filters, bandpass, and heat protection filters, and for cold‐light and laser mirrors, have to be produced to extremely tight tolerances.

Citation

(1989), "In‐situ‐photometer for thin‐film processes", Pigment & Resin Technology, Vol. 18 No. 7, pp. 12-13. https://doi.org/10.1108/eb042625