To read this content please select one of the options below:

Determination of the weighted mean path length of the Epstein frame

Kong Qingyi (Department of Electrical Engineering, Hebei University of Technology, China)
Zhiguang Cheng (R&D Center of Baoding Tianwei Group, Baoding, China)
Xiaoyan Wang (R&D Center of Baoding Tianwei Group, Baoding, China)
Yana Fan (R&D Center of Baoding Tianwei Group, Baoding, China)
Lanrong Liu (R&D Center of Baoding Tianwei Group, Baoding, China)
Tao Liu (R&D Center of Baoding Tianwei Group, Baoding, China)
Jing Guo (R&D Center of Baoding Tianwei Group, Baoding, China)
114

Abstract

Purpose

The purpose of this paper is to investigate the effects of the related factors on the mean path length of the Epstein frame and propose a weighted method based on the different specific losses to decide the actual mean path length of the Epstein frame.

Design/methodology/approach

Two Epstein frames of different dimensions (i.e. standard 25 cm and revised 17.5 cm Epstein frame) are used in experiments, and two kinds of the mean path lengths, lm1 and lm2, are defined based on the different specific iron losses produced at the middle part of the limb and the rest of the whole frame, respectively.

Findings

The mean magnetic path varies with many factors such as peak flux density, excitation frequency, permeability as well as the anisotropy of the material under test.

Originality/value

The results play an important role in designing the transformer core and the building factor.

Keywords

Acknowledgements

The authors thank all colleagues of R&D Center, Baoding Tianwei Group Co., Ltd, for their energetic support and helpful discussion. This work was supported by the China Postdoctoral Science Foundation under Grant 2011M500534 and the China Postdoctoral Science Foundation under Grant 2012T50242.

Citation

Qingyi, K., Cheng, Z., Wang, X., Fan, Y., Liu, L., Liu, T. and Guo, J. (2014), "Determination of the weighted mean path length of the Epstein frame", COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, Vol. 33 No. 1/2, pp. 224-233. https://doi.org/10.1108/COMPEL-11-2012-0336

Publisher

:

Emerald Group Publishing Limited

Copyright © 2014, Emerald Group Publishing Limited

Related articles