COMPEL - The international journal for computation and mathematics in electrical and electronic engineering: Volume 15 Issue 2

Subject:

Table of contents

Multilevel solution of augmented drift‐diffusion equations

M.B. Davis, G.F. Carey

Develops a finite element analysis and solution strategy for the augmented drift‐diffusion equations in semiconductors device theory using a multilevel scheme. Decouples the…

Digital plane waves

Pierre Hillion

Notes that Scalar digital plane waves are made of a finite or infinite sequence of discrete pulses which are solutions of a wave equation. Discusses the 1D and 2D wave equations…

195

A fast Poisson solver for realistic semiconductor device structures

M. Walmsley, R.A. Abram

Combines the techniques of fast Fourier transforms, Buneman cyclic reduction and the capacity matrix in a finite difference Poisson solver specifically designed for modelling…

Eddy current modelling in a coupled electromagnetic‐mechanical problem

Nicolaos J. Siakavellas

Solves a coupled electromagnetic‐mechanical problem ‐ that of a cantilevered conductive plate in crossed steady and time‐varying magnetic fields ‐ by using a semi‐analytical…

A new method to compute the capacitance of the circular patch resonator

G. Miano, G. Panariello, V.G. Vaccaro, L. Verolino

Discusses an analytical solution for the capacitance of the circular microstrip patch resonator. Shows that the electrostatic problem can be formulated as a system of dual…

230

Correspondence item: On comparison of Levinson, hybrid, and maximum entropy spectral estimation methods with the 2‐D minimum free energy method

P. Kiernan

Discusses the 2‐D minimum free energy (MFE) parameter and spectral estimation method and presents an algorithm for its implementation. Notes a profound lack of results in the…

Cover of COMPEL - The international journal for computation and mathematics in electrical and electronic engineering

ISSN:

0332-1649

Online date, start – end:

1982

Copyright Holder:

Emerald Publishing Limited

Open Access:

hybrid

Editor:

  • Prof Jan Sykulski